Reciprocal Frame Architecture

Reciprocal Frame Architecture
By Olga Popovic Larsen

Publisher: Architectural Press
Number Of Pages: 208
Publication Date: 2008-01-21
ISBN-10/ ASIN: 0750682639
ISBN-13/ EAN: 9780750682633

In structural terms reciprocal frame structures are 'three dimensional assemblies of mutually supporting beams'. But behind this definition lie some breathtakingly beautiful and complex structures at the heart of buildings both ancient and modern. This new book explores the principles of these apparently simple structures and demonstrates how they can be used in the context of a modern building.

Starting with historic designs by de Honnecourt, Da Vinci and Serlio, the book presents the wealth of possible RF morphologies, and investigates the geometrical, structural and practical design issues of reciprocal frames.

The case studies look at stunning examples of reciprocal frame architecture that range from low environmental impact buildings and self built examples in the UK and USA, to the fascinating and elegant structures of the Puppet Theatre in Seiwa, Tokyo's Spinning House, Sukiya -Yu house, The Toyoson Stonemason museum and the Life Sciences Laboratory - Torikabuto in Japan.

The book is designed to inform and inspire architects and structural engineers alike, and brings to life a structural system whose principles have been used for thousands of years.

* Simple introduction to the design principles of mutually supporting structures
* Explores the impact of structural choices on the aesthetic impact of a building
* Highly illustrated case studies from across the globe

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The Physics And Modeling of MOSFETs

The Physics And Modeling of Mosfets (International Series on Advances in Solid State Electronics)
By Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ezaki

Publisher: World Scientific Publishing Company
Number Of Pages: 350
Publication Date: 2008-06-03
ISBN-10/ ASIN: 9812568646
ISBN-13/ EAN: 9789812568649

This volume provides a timely description of the latest compact MOS transistor models for circuit simulation. The first generation BSIM3 and BSIM4 models that have dominated circuit simulation in the last decade are no longer capable of characterizing all the important features of modern sub-100nm MOS transistors. This book discusses the second generation MOS transistor models that are now in urgent demand and being brought into the initial phase of manufacturing applications. It considers how the models are to include the complete drift-diffusion theory using the surface potential variable in the MOS transistor channel in order to give one characterization equation.

Contents:

* Semiconductor Device Physics
* Basic Compact Surface-Potential Model of the MOSFET
* Advanced MOSFET Phenomena Modeling
* Capacitances
* Leakage Currents and Junction Diode
* Modeling of Phenomena Important for RF Applications
* Summary of HiSIM s Model Equations, Parameters, and Parameter-Extraction Method.

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Hacking Exposed Linux

Hacking Exposed Linux (Hacking Exposed)
By ISECOM

Publisher: McGraw-Hill Osborne Media
Number Of Pages: 813
Publication Date: 2008-07-15
ISBN-10/ ASIN: 0072262575
ISBN-13/ EAN: 9780072262575

The Latest Linux Security Solutions

This authoritative guide will help you secure your Linux network--whether you use Linux as a desktop OS, for Internet services, for telecommunications, or for wireless services. Completely rewritten the ISECOM way, Hacking Exposed Linux, Third Edition provides the most up-to-date coverage available from a large team of topic-focused experts. The book is based on the latest ISECOM security research and shows you, in full detail, how to lock out intruders and defend your Linux systems against catastrophic attacks.

* Secure Linux by using attacks and countermeasures from the latest OSSTMM research
* Follow attack techniques of PSTN, ISDN, and PSDN over Linux
* Harden VoIP, Bluetooth, RF, RFID, and IR devices on Linux
* Block Linux signal jamming, cloning, and eavesdropping attacks
* Apply Trusted Computing and cryptography tools for your best defense
* Fix vulnerabilities in DNS, SMTP, and Web 2.0 services
* Prevent SPAM, Trojan, phishing, DoS, and DDoS exploits
* Find and repair errors in C code with static analysis and Hoare Logic

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Low-Frequency Noise in Advanced MOS Devices

Low-Frequency Noise in Advanced MOS Devices (Analog Circuits and Signal Processing)
By Martin v. Haartman, Mikael Östling

Publisher: Springer
Number Of Pages: 216
Publication Date: 2007-07-23
ISBN-10/ ASIN: 1402059094
ISBN-13/ EAN: 9781402059094

Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

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Production Testing of RF and System-on-a-Chip Devices for Wireless Communications

Production Testing of RF and System-on-a-Chip Devices for Wireless Communications
By Keith, B. Schaub

Publisher: Artech House Publishers
Number Of Pages: 272
Publication Date: 2004-03-31
ISBN-10/ ASIN: 1580536921
ISBN-13/ EAN: 9781580536929

With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.

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